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Extracts epsilon_innovation (AR1 process innovations) and eta from posterior samples. These represent the temporal deviations from the expected coverage trajectory along with the underlying fitted values.

Usage

get_inno_samples(fit)

Arguments

fit

Fitted model object containing: samplescmdstan samples with epsilon_innovation CT and eta CT dataData frame with iso, country, name_region, year time_indexTime index mapping with columns t and year geo_unit_indexGeographic unit index with cluster/subcluster info

Value

Nested tibble with one row per (iso, year) containing:

iso

ISO country code

year

Year

cluster

WHO region cluster (if available)

subcluster

Regional subcluster (if available)

name_region

Region name (if available)

draws

Nested tibble with draw-specific columns:

  • draw: Posterior draw number

  • eta: Eta parameter on probit scale

  • sd_y: Scale parameter (always 1 for standardized innovations)

  • residual: Innovation value (epsilon_innovation)

  • level: Fitted coverage on inv-probit scale

  • level_prop: Eta on proportion scale

  • yhat: Fitted value on inv-probit scale (same as level)

  • y: Reconstructed observation (residual + yhat)

  • sd_y_prop: Standard deviation on proportion scale

  • y_prop: Reconstructed observation on proportion scale

Details

Only returns innovations for years within the observation range for each country (min_obs_yr to max_obs_yr).