Extracts epsilon_innovation (AR1 process innovations) and eta from posterior samples. These represent the temporal deviations from the expected coverage trajectory along with the underlying fitted values.
Value
Nested tibble with one row per (iso, year) containing:
- iso
ISO country code
- year
Year
- cluster
WHO region cluster (if available)
- subcluster
Regional subcluster (if available)
- name_region
Region name (if available)
- draws
Nested tibble with draw-specific columns:
draw: Posterior draw number
eta: Eta parameter on probit scale
sd_y: Scale parameter (always 1 for standardized innovations)
residual: Innovation value (epsilon_innovation)
level: Fitted coverage on inv-probit scale
level_prop: Eta on proportion scale
yhat: Fitted value on inv-probit scale (same as level)
y: Reconstructed observation (residual + yhat)
sd_y_prop: Standard deviation on proportion scale
y_prop: Reconstructed observation on proportion scale